| Name: | Dr. Ralf Arnold |
| Residence: | Härtsfeldstr. 9/1 73432 Aalen Germany |
| Phone: | +49 7367 920798 |
| Mobile: | +49 0160 90828398 |
| Web: | www.arnolds.de |
| E-Mail: | ralf@arnolds.de |
| Personal Data: | |
| Date of birth: | 06.03.1966 |
| Place of birth: | Saalfeld (Saale) |
| Marital status: | married, no children |
| Nationality: | Federal Republic of Germany |
| Education: | |
| 1972-1979 | comprehensive school |
| 1979-1984 | secondary school |
| Military Service: | |
| 1984-1988 | military service, discharged as second lieutenant (honorable) |
| University Training: | |
| Period: | 1988-1993 |
| Field: | Physics |
| University: | Friedrich-Schiller-Universität Jena |
| Degree | Diploma of Physics (Univ.) (comparable to MSc.) |
| Special topics: | applied and technical optics |
| Diploma thesis: | done in the field of optical measurement techniques |
| Topic: | "Theoretical and experimental examinations of physical and technical limitations by measuring of geometrical properties using the laser measurement system ZLM 300" |
| Period: | 1997-2001 |
| Field: | Chemistry (PhD) |
| University: | Ruhr-Universität Bochum |
| Degree | Dr. rer. nat. |
| Dissertation: | Physical Chemistry: Organic monolayers at surfaces |
| Topic: | "Structure and order of self-assembled monolayers of aliphatic and aromatic thiole at gold surfaces" |
| Professional Work: | |
| 1994-1997 | product developer, O.K.Tec GmbH, Jena |
| contents | product development, sales and application - development of several UV/VIS/NIR spectrometers: - development of a fiber coupled probe for straylight-, fluorescence- and raman spectroscopy - development of a FTNIR process spectrometer - sales of all products of the company mainly in chemical plants |
| 1997-2001 | scientific employee, Ruhr-University Bochum (Ph.D. student), Department of Physical Chemistry I, Prof. Ch. Wöll |
| contents | - self assembled monolayers - manufacturing and exploration of ultrathin films at surfaces (surface science) - methods: IR spectroscopy (main), XPS, NEXAFS, LEED, TDS, AFM, STM |
| 2001- | scientific employee at the optical industry (developer, project manager) |
| Miscellaneous: | |
| Expertise: |
optical gratings optical spectroscopy (UV-VIS-NIR-MIR) surface analytical techniques (XPS, NEXAFS, LEED, TDS, AFM, STM) ultrahigh vacuum equipment optical fibers (properties and assembly) interferometry applied and technical optics and measurement techniques (interferomety, crystal optics, optical imaging) sales and field service experiences (direct selling of analytical measurement devices) project management in teh field of high end optics |
| Publications und Patents: | see list of scientific and technical publications |
State: 03/2008